System Details
Photonic Science back reflection Laue system allows real-time crystal orientation down to 0.1 degrees accuracy. The system delivers an intense X-ray beam with less than 0.3mm on sample. Single crystals electro optical properties are strongly dependent on crystallographic orientations.
The LAUE tool collects a high resolution X-ray diffraction pattern from the single crystal out of which the right crystallographic plane cut can be selected with excellent accuracy.
Specifications
| <200μm beam size | For small crystals |
| Motorised stages | Allows scanning along the growth axis |
| Motorised gonios | Direct compatibility with synchrotron / Neutron facilities set up |
| Manual gonios | Direct compatibility with cutting tools |
| <200μm beam size | Works with small grain polycrystalline structures |
| Large scanning linear stages | Allows automatic wafer or multiple sample mapping |
| Motorised Z stage | Allows compatibility with large rod / samples |
| Manual gonio | Allows seed orientation down to +/- 0.02 degree accuracy |
Video
Laue Crystal Orientation System
If you would like to learn more about our Laue Crystal Orientation System, simply contact a member of the Photonics Science team today.
Photonic Science’s sister company Scintacor offers CsI and Gadox coatings for fibre optics and other components.
