Laue Single Crystal Orientation System
A range of compact cabinet systems delivering high-accuracy in real-time for research and industry
Laue Software
All Laue Systems are supplied with a preconfigured PC (including monitor, keyboard, and mouse) with dedicated software for live image acquisition and crystal orientation.
The orientation software module displays simulated sample diffraction patterns, from a defined crystal system, over the acquired experimental image to index and orient crystal samples. Typically a solution is found within seconds from a random Si orientation.
The software enables end-user control of exposure time, frame averaging to improve signal-to-noise ratio, pixel binning, and programmable sequences.
Applications
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Automatically detects diffraction spots
and calculates spot position against reference crystal -
Automatically calculates mis orientation
against goniometer and crystallographic axis -
Intuitive workflow for multiuser operation
and non-expert crystallography users -
Saves angular measurements in CSV format
for Quality Assurance traceability - Images in TIF / BMP / JPEG formats
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Built-in Macro interface
for automating repetitive routines - Compatible with CFL data files
- Dual Gigabit Ethernet interface
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Remote access control
for ongoing service support, minimising downtime
Laue Image Gallery
Sapphire C-axis aligned
SiC Hex aligned
Silicon alignment to better than 0.1 degree accuracy
Two dimensional orientation map
Poly crystalline Si wafer
Extraction of contours and centoids for x-ray analysis
