15th Jan, 2021
Industrial Laue Systems Single-crystal materials play an important role in mass manufacturing products such as lasers and turbine blades. They play a crucial role in industrial applications requiring radio frequency GaAs substrates, CdTe radiation detectors, laser emitters, piezo sensors, InSb Mid Wave Infra-Red detectors, or synthetic diamond substrates for new quantum detectors. The fields of…
12th Jan, 2021
Max Von Laue (9th October 1879 – 23 April 1960) discovered a phenomenon known as “diffraction patterns” occurs when waves pass through small, tightly spaced openings in a screen. In 1912, Max von Laue came upon the idea that X-rays passing through crystals might create similar patterns. That is, that a crystal’s structure would correspond…
12th Jan, 2021
X-ray computed microtomography allows the rendering of a virtual 3D model of an object with spatial resolutions in the micrometre regime. To achieve high resolution reconstruction, the characteristics of the X-Ray detector plays an important role. Besides other parameters, the size of the detector pixels determines which resolution is accessible with a certain X-ray micro…
12th Jan, 2021
Coming soon the New sCMOS 4123 Camera 24/7 Surveillance colour and NIR delivers low light level imaging down to <30 micro lux faceplate illumination. The camera closes the gap between Gen2 intensified cameras without image burn-in artefacts or halo saturation effects. The resolution at higher light levels is un compromised by the presence of a…
8th Jan, 2021
2D Orientation Mapping of Silicon Wafers with Laue Diffraction Silicon wafers form the basis of modern microelectronics and photovoltaic technology. They need highly accurate alignment with regards to their crystalline orientation when they undergo various processing steps. It is possible to determine the crystlaline structure of a silicon wafer with a hammer and nail—but…
