Photonic Science back reflection Laue system allows real-time crystal orientation down to 0.1 degrees accuracy. The system delivers an intense X-ray beam with less than 0.3mm on sample. Single crystals electro optical properties are strongly dependent on crystallographic orientations.
The LAUE tool collects a high resolution X-ray diffraction pattern from the single crystal out of which the right crystallographic plane cut can be selected with excellent accuracy.
|<200μm beam size||For small crystals|
|Motorised stages||Allows scanning along the growth axis|
|Motorised gonios||Direct compatibility with synchrotron / Neutron facilities set up|
|Manual gonios||Direct compatibility with cutting tools|
|<200μm beam size||Works with small grain polycrystalline structures|
|Large scanning linear stages||Allows automatic wafer or multiple sample mapping|
|Motorised Z stage||Allows compatibility with large rod / samples|
|Manual gonio||Allows seed orientation down to +/- 0.02 degree accuracy|
Laue Crystal Orientation System
If you would like to learn more about our Laue Crystal Orientation System, simply contact a member of the Photonics Science team today.