Laue Single Crystal Orientation System
A range of compact cabinet systems delivering high-accuracy in real-time for research and industry
System Options
Vertical Configuration
Flexible configuration using a vertical beam path for high throughput scanning of multiple crystals in isolation, or multiple areas of interest.
Using gravity, samples do not need to be adhered to platform, allowing easier mounting and orienting of crystals.
Horizontal Configuration
Traditional horizontal beam geometry is well suited to orient the crystal for cutting or to quickly scan the crystal to identify reflections.
Speak with our expert team to help determine which configuration option best suits your requirements.
Grain Map System
Vertical system featuring a special camera, lens, illumination, and mapping software to measure the orientation of each grain.
Grain Map systems include a fully motorised XYZ stage and goniometer as standard. Ideal for grain mapping Silicon Wafers.
Benefits of a Vertical System
- A vertical beam path takes up less room in the cabinet, leaving more space for experiments
- Allows scanning experiments with wafers, rods, and multiple samples, for example diamonds on trays up to 30 x 30 cm
- Compatible with additional optics or inspection modalities
- Safer mounting of samples away from detector
- Allows motorised goniometers to operate at larger tilt and rotation degree
- Laser-guided distance sensor for more accurate and repeatable sample positioning
- More loading space makes sample setup easier and faster
- Software supports macro routines
Laue System Options
Laue-LT
Laue
Laue-XT
Vertical Configuration
On request
Horizontal Configuration
Grain Map System
Vertical only
Mechanical Distance Measurement Tool
Horizontal only
Laser-Guided Distance Measurement Tool
Vertical only
On request
Manual XYZ Stage & Goniometer
Motorised XYZ Stage & Goniometer
Sample Alignment Camera - as standard
X-ray Source Alignment Camera
Automated Point-Scanning Routines
Laue-XT
Laue-XT
Laue-XT
Vertical Configuration
- On request
Horizontal Configuration
Grain Map System
- Vertical only
Mechanical Distance Measurement Tool
- Beam pointer
- Beam pointer
- Pointer arm
Laser-Guided Distance Sensor
- Vertical only
