Scanning Electron Microscopy

A scanning electron microscope (SEM) produces images of a sample by scanning the surface with a focused beam of electrons.

The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Back scattered electrons diffracted from a stationary beam will create a pattern that can be captured by a CMOS camera that will unveil microstructural information such as grain orientation, phase and texture.

X-Ray sCMOS 4MP Detector X-Ray sCMOS 16MP Detector