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Quantitative Extended SWIR imaging and spectroscopy

The camera uses selected extended wavelengh InGaAs focal plane arrays with sensitivity in the 1100 to 2200 nm wavebands.

Thanks to efficient cooling and stable offset, the InGaAs camera allows reproducible acquisition for precise metrology measurements in the extended SWIR spectrum. Camera Link and Gigabit Ethernet Vision compliant interface enables easy integration into existing systems.

Specifications

Spectral Range 1100 - 2200 nm
Resolution 640 x 512
Sensor Size 9.6 mm x 7.68 mm
Frame Rate 174 fps at full VGA resolution
570 fps at ¼ VGA resolution
7,200 fps at 640x4 resolution (spectroscopy or line mode)
Pitch 15μm x 15μm
Full Well Capacity 20k - 23k electrons (high gain mode)
80k - 105k electrons (mid gain mode)
1.0M - 1.5M electrons (low gain mode)
Read Out Noise 28 - 38 electrons (high gain mode)
50 - 77 electrons (mid gain mode)
500 - 800 electrons (low gain mode)
Reading Mode Integrate Then Read, Integrate While Read
Dark Current <300fA with air cooling & <0.1fA with water cooling
Sensor Temperature (ºC) -25°C with air cooling, -50°C with water cooling (lower dark current)
Corrections Non uniformity, bright pixel, gain, offset, flatfield
ADC 14-bit with 16-bit digital processing
Exposure 30 microseconds up to 20 milliseconds
QE at 1500 nm 80%, QE at 2050 nm 70%