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Overview from our R & D Manager Scott York

10th Dec, 2019

The engineering team at PSEL have many years’ experience in customising standard camera designs to suit the requirements of individual customers and OEMs. Examples include the design and manufacture of very large format fibre optic input X-ray cameras, with multiple sensors bonded to an array of tapered fibre optics; a range of scintillator options for X-ray detectors (Gadox, CsI, aluminised, single crystal, with a range of substrates); camera variants with different video and control interfaces (such as HD-SDI, RS485); small board-level modules for OEM integration as opposed to fully cased units; optimisation for very long exposure times (deep cooling, temperature control, post-processing customisation); modification to suit external hardware such as X-ray sources, linear and rotary stages, spectrometers and custom optics; and additional operating modes for particular applications (higher frame rate, image flip, custom synchronisation inputs and outputs, extended dynamic range). Many of these customisations will require customer-specific test and set-up procedures, to ensure compliance with the customer specifications, which are prepared and carried out by the highly qualified test engineering team.

Complete system design and manufacture

PSEL are able to offer complete turnkey systems in addition to individual cameras and detectors, for those customers who require a complete solution for their imaging application. In the X-ray diffraction field, Laue systems combine the PSEL Laue back-diffraction X-ray imaging camera, together with an X-ray source, X-ray focussing optic, and goniometer with linear and rotary stages for mounting and orienting crystal samples, all enclosed within an interlocked lead-shielded X-ray cabinet for benchtop mounting. The PSEL software integrates all of these items into a single application that provides control of all hardware components together with a range of post processing features such as X-ray diffraction spot analysis for crystal orientation. Other systems that PSEL manufactures include X-ray detector systems for ultra-high resolution using multiple stitched images; pre-aligned and calibrated multi-camera multispectral assemblies comprising visual and SWIR waveband cameras and spectrometers; systems for inspection of silicon solar cell wafers by combined X-ray diffraction and optical analysis using structured lighting; and systems for long range surveillance comprising low light level visual and SWIR waveband imagers combined with motorised lenses and spectral filters to provide optimum 24 hour imaging under a wide range of atmospheric conditions.
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Scott York R&D Manager Photonic Science

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